Optical Characterization of Thin Solid Films

Introduction and modelling activities.- Optical film characterization topics: An overview.- Universal dispersion model for characterization of optical thin films over wide spectral range.- Predicting optical properties of oxides from ab initio calculations.- Spectrophotometry and spectral ellipsometry.- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry.- Data processing methods for imaging spectrophotometry.- In-situ and ex-situ spectrophotometry in thin film characterization.- Ellipsometric characterization of thin solid films.- Characterization of defective and corrugated coatings.- Optical characterization of thin films exhibiting defects.- Scanning probe microscopy characterization of optical thin films.- Resonant grating waveguide structures.- Absorption and scatter.- Roughness and scatter in optical coatings.- Absorption and fluorescence measurements in optical coatings.- Cavity ring-down technique for optical coating characterization.

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• Dispositivos e materiais electrónicos
• Análise de espectro, spectrochemistry, espectrometria de massa
• Ciência dos materiais
• Óptica aplicada
• Física da Matéria Condensada (física do estado sólido e estado líquido)

Optical Coating Characterization;Optical Properties of Thin Solid Films;Optical Constants;Interface Spectroscopy;Solid State Spectroscopy;Spectroscopic Imaging Spectrophotometry