Charge-Trapping Non-Volatile Memories

Charge-Trapping Non-Volatile Memories

Volume 2--Emerging Materials and Structures

Dimitrakis, Panagiotis

Springer International Publishing AG

07/2018

211

Mole

Inglês

9783319839998

15 a 20 dias

454

Descrição não disponível.

Materials and Device Reliability in SONOS Memories.- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices.- Hybrid Memories Based on Redox Molecules.- Organic Floating-Gate Memory Structures.- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.

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3D Non-volatile Memories;Charge-trapping Layer;Charge-trapping Memories;Flash Memories;MAHOS;MANOS;MONOS;Nitride Memories;Non-volatile Memories;SONOS;Semiconductor Memories;TANOS