Spectroscopic Ellipsometry for Photovoltaics

Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se2.- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization.- Cu2ZnSn(S,Se)4 and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.

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• Tecnologia das fontes de energia renovável e alternativa
• Dispositivos e materiais electrónicos
• Laser física
• Engenharia electrónica

Amorphous Si solar cells;CIGS growth ananlysis;Compound solar cells;Hybrid perovskites;Microcrystalline Si solar cells;Nanomaterial-based solar cells;Optical analysis of solar cells;Optical constants of solar materials;Organic solar cells;Si heterojunction solar cells;Spectroscopic ellipsometry