Contactless VLSI Measurement and Testing Techniques

1. Conventional Test Methods. - 2. Testability Design.- 3. Other Techniques Based on the Contacting Probe.- 4. Contactless Testing.- 5. Electron-Beam and Photoemission Probing.- 6. Electro Optic Sampling and Charge Density Probe.- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe.- 8. Probing Techniques Based on Light Emission from Chip.- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits.- 10. Comparison of Contactless Testing Methodologies.

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• Arquitectura do computador e projecto lógico
• Engenharia electrónica
• Circuitos e componentes

Integrated Circuit Reliability;Integrated Circuit Test Engineering;VLSI Test Principles and Architectures;VLSI Design For Testability;Contactless Testing